작성일
2023.12.11
수정일
2023.12.11
작성자
서준호
조회수
53
[SCIE] Bypassing Heaven’s Gate Technique Using Black-Box Testing
Bypassing Heaven’s Gate Technique Using Black-Box Testing
Classification
SCI(E) Journal
Authors
Seon-Jin Hwang, Assem Utaliyeva, Jae-Seok Kim, Yoon-Ho Choi
Title
Bypassing Heaven’s Gate Technique Using Black-Box Testing
Publisher
Sensors
Status
Sensors, 26 November 2023
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